C. Miccoli, J. Barber, C. Monzio Compagnoni, G. M. Paolucci, J. Kessenich, A. L. Lacaita, A. S. Spinelli, R. Koval, A. Goda, "Resolving discrete emission events: a new perspective for detrapping investigation in NAND Flash memories". Best Student Paper Award in the International Reliability Physics Symposium (IRPS) during the 2013's edition held in April 14th to 18th in Monterey - CA - USA.

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