Cristiana Bolchini and Antonio Miele won the IEEE DFT Best Paper Award 2010 with the paper "Reliability-Driven System-Level Synthesis of Embedded Systems". The 2010 prize was awarded during the 2011 edition of the DFT (IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems), an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. Further information is available at http://www.dfts.org/index.htm

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Best paper awards

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