C. Miccoli, C. Monzio Compagnoni, L. Chiavarone, S. Beltrami, A. L. Lacaita, A. S. Spinelli, and A. Visconti, "Reliability characterization issues for nanoscale Flash memories: a case study on 45-nm NOR devices," IEEE Trans. Device Mater. Rel., vol. 13, pp. 362-369, June 2013.

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