Iurii Eremeev, a Ph.D. student in Information Technology at the Semiconductor Devices and Integrated Circuits Laboratory of the Department of Electronics, Information and Bioengineering – Politecnico di Milano, has won the Best Poster Award at the Trento Workshop on Advanced Silicon Radiation Detectors 2025, an international conference in its 20th edition, held in Trento from February 4 to 6, 2025.
The award was granted for the poster "Performance of an X-γ ray detection system based on a thick silicon LGAD."
The research, co-authored by Filippo Mele and Giuseppe Bertuccio and conducted in collaboration with Wei Chen and Gabriele Giacomini from Brookhaven National Laboratory (NY, USA), focused on the study of Low Gain Avalanche Detectors (LGAD) as spectroscopic X-ray detectors.
LGADs, originally developed in 2012 as particle detectors with high time resolution, feature a sub-micrometric semiconductor region that enables controlled charge multiplication, thereby amplifying the signal within the detector itself.
By analyzing the electronic noise of high-thickness LGADs, the study experimentally demonstrated that these novel devices, under specific conditions, can achieve superior performance compared to conventional junction detectors, opening new perspectives for X-ray spectroscopy applications.
This work was realized in part within the MUSA – Multilayered Urban Sustainability Action – project, funded by the European Union (EU) – NextGenerationEU, PNRR Mission 4, and in part funded by the Italian Ministry for University and Research (MUR) and by the European Union (EU) under the project FSE REACT-EU, PON Ricerca e Innovazione 2014-2020-DM 1062/2021.
