Probe stations

Climatic Chamber

Optical microscopes

Instrumentation for test and characterization of detectors:

• LCR-meter
• Semiconductor device Analyzer
• Spectrum Analyzer
• Programmable Electrometer
• Instruments for I-V and C-V characterization

CAD software for devices and VLSI circuits development

Acquisition Systems:

• Shaper Amplifiers (unipolar and bipolar)
• Multichannel Analyzer/Dual Input Multiscaler
• ADC + acquisition board
• Single Channel Analyzer & Time to Amplitude Converter

Pulsers and Functions / Arbitrary wave generator

Digital real-time oscilloscopes with bands up to 1 GHz

Logic State Analyzers up to 2 GHz

Network analyzer