Automated Test Input Generation for Machine Learning Based Software Systems
Vincenzo Riccio
(USI) Lugano, Switzerland
DEIB - Seminar Room "N. Schiavoni" (Building 20)
June 7th, 2022
10.00 am
Contacts:
Luciano Baresi
Research Line:
Advanced software architectures and methodologies
(USI) Lugano, Switzerland
DEIB - Seminar Room "N. Schiavoni" (Building 20)
June 7th, 2022
10.00 am
Contacts:
Luciano Baresi
Research Line:
Advanced software architectures and methodologies
Sommario
On June 7th, 2022 at 10.00 am, Vincenzo Riccio Postdoctoral Researcher with the Software Institute (USI) Lugano, will hold a seminar on "Automated Test Input Generation for Machine Learning Based Software Systems" in DEIB Seminar Room.
Machine Learning based software systems are everywhere, also in safety-critical applications. We have to carefully test them before it is too late". Many seminars, research papers and secret meetings to avoid the rise of the machines start with a similar, haunting refrain. And they are right.
In this talk, I will describe how the Software Engineering research community is producing new test inputs to assess the quality of machine learning based software systems.
Machine Learning based software systems are everywhere, also in safety-critical applications. We have to carefully test them before it is too late". Many seminars, research papers and secret meetings to avoid the rise of the machines start with a similar, haunting refrain. And they are right.
In this talk, I will describe how the Software Engineering research community is producing new test inputs to assess the quality of machine learning based software systems.
Biografia
Vincenzo Riccio is a Postdoctoral Researcher with the Software Institute of Università della Svizzera Italiana (USI) in Lugano, Switzerland. He received his Ph.D. degree in Information Technology and Electrical Engineering from the University of Naples Federico II (Italy) in 2019. His current research is focused on test automation for machine learning-based software. He serves as a reviewer for international Software Engineering conferences and journals (e.g., TOSEM and TSE). He is Guest Editor of the EMSE journal’s special issue on Software Testing in the Machine Learning Era.
