The International Reliability Physics Symposium (IRPS) is the main IEEE conference about reliability of electronic integrated devices. In the context of the 2012 edition, which took place from 15th to 19th of April in Anaheim - CA - USA, Carmine Miccoli was awarded the Best Student Paper Award for the paper:
C. Miccoli, C. Monzio Compagnoni, L. Chiavarone, S. Beltrami, A.L. Lacaita, A.S. Spinelli, and A. Visconti, "Assessment of Distributed-cycling Schemes on 45nm NOR Flash Memory Arrays".
The work was developed in collaboration with the Micron Technology Inc. in Agrate Brianza.